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Qaagi - Book of Why

Causes

Effects

a small overstresswill ... causefailure of transistor device

the eventcausesone transistor to fail

An excessively high voltagecan causetransistor breakdown failure , and

An excessively high voltagecan causetransistor breakdown failure

I can seecould ... causea failure of the switching transistor altogether

an overly high currentcan causetransistor meltdown failure

undesirable hot carrierscausepremature transistor failure

a solenoid(passive) caused byA very unusual transistor failure

by a high DC voltage key line(passive) caused bytransistor failure

the gate voltage required to generate a current in the channel increasespotentially causingfailure of the transistor

This ( large ) current pulsecan leadto transistor failure

some load variationwill causea failure of the transistor

Improperly chosen components and wrong circuit designcan also resultin transistor failure

by the degradation of the gate oxide layer(passive) caused bya transistor error

as oftencan causetransistor failure

bad(passive) is often caused byTransistor failure

a dielectric breakdown(passive) could be caused byA failure of a transistor

any defectcan causetransistor failure

if exceeded in operationmay resultin transistor failure

The cumulative effect of many switching cyclesmay ultimately leadto transistor failure

any tiny defect in the structurecould causea transistor failure

by a mismatched load(passive) caused byTransistor failure

ESD eventscausingfailure of the transistor

Thermal runawaycould causetransistor failure

bad capacitors(passive) is often caused byTransistor failure

very high temperaturescan leadto the failure of the transistor

by excessively high voltages that are above(passive) caused bytransistor failure

by excessively high voltages(passive) caused bytransistor failure

The " Absolute Maximum Ratings " of the transistor ... if exceeded in operationmay resultin transistor failure

by excessively high voltages trend lines(passive) caused bytransistor failure

This trapped charge ... an undesirable drift in the conduction thresholdcan leadto transistor failure

by electrical overstress damage across most of the emitter region of the die(passive) caused byTransistor failure

electrical overstress damage across most of the emitter region of the die(passive) caused byTransistor failure

by a sliver of aluminum that became lodged(passive) caused bya transistor failure

by a sliver of aluminum that became lodged and shorted the system on the shutter pulse switching circuit(passive) caused bya transistor failure

a sliver of aluminum that became lodged and shorted the system on the shutter pulse switching circuit(passive) caused bya transistor failure

Who knewdiscovered" transistor - effect

Such an over - current conditioncan resultin catastrophic failure of the transistor

Any of those conditionswould causethe transistor to fail

contaminationcausedthe transistor to fail

the mains fuse to blowcausingthe mains fuse to blow

This low power situation(passive) could be caused byThis low power situation

a fault , not a slow , circuitwill causea fault , not a slow , circuit

the catastrophic results(passive) may be caused bythe catastrophic results

in a fuse blow outresultsin a fuse blow out

from ESDresultingfrom ESD

your exact issuecan causeyour exact issue

noises like thatmight also causenoises like that

individual " dead pixelscausesindividual " dead pixels

both the single and twoto designboth the single and two

the problemcausingthe problem

the problemwas causingthe problem

this problemcan ... causethis problem

as wellcausingas well

The bias issue(passive) was caused byThe bias issue

all sort of issuescan causeall sort of issues

to ' time - dependent ' variationleadsto ' time - dependent ' variation

the system failurewas causingthe system failure

a short circuitcould causea short circuit

A completely missing color(passive) is usually caused byA completely missing color

to the low outputleadto the low output

in a blown resistor and fried traceresultedin a blown resistor and fried trace

the unit to smokecan causethe unit to smoke

for UHF distribution amplifierswere designedfor UHF distribution amplifiers

the ECU to read badcould ... causethe ECU to read bad

the ECU to read badcould possibly causethe ECU to read bad

the loss of a certain functionmay have causedthe loss of a certain function

Such thing(passive) can be caused bySuch thing

in an input offset or offset voltageresultin an input offset or offset voltage

Most of the LO leakage problems(passive) are caused byMost of the LO leakage problems

the LO leakage problems(passive) are caused bythe LO leakage problems

a very brief flash of the backlight or no backlightwould likely causea very brief flash of the backlight or no backlight

for low to medium current , low poweris designedfor low to medium current , low power

at an OFF stateis setat an OFF state

for VHF / UHF RF power amplifiers applicationsspecifically designedfor VHF / UHF RF power amplifiers applications

for operationdesignedfor operation

for Class B push - pull audio amplifier and general purpose applicationsdesignedfor Class B push - pull audio amplifier and general purpose applications

for VHF RF power amplifiers applications FEATURES High power gainspecifically designedfor VHF RF power amplifiers applications FEATURES High power gain

for high voltage switching applicationsdesignedfor high voltage switching applications

for high current switching applicationsdesignedfor high current switching applications

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Smart Reasoning:

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