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to trackmay causehigh process variation
the fourth embodimentsetsthe amount of process variation
Abilityto ... leadprocess change
the abilityto influenceprocess change
To enable participantsto leadprocess change
_ Demonstrates leadershipinfluencesprocess change
Demonstrated abilityto leadprocess change
Demonstrated abilityto successfully leadprocess change
on which physicians and nurses were on pointto leadprocess change
Advises on best practicesleadsprocess change
people across organizational boundaries ... a clear and strategic directionto leadprocess change
by causes that are out of their control(passive) are caused bydistinguish process variation
any external variable that causes change in the resulting plastic part 's dimensions or physical properties(passive) can be caused byProcess variation
the relative influence of the factors and interactionscausevariation in a process
by special factors(passive) caused bythe process variation
by certain fabrication steps , including information about the results of specific processes and how those processes were performed(passive) caused byprocess variations
by certain fabrication steps , including information about the results of specific processes(passive) caused byprocess variations
by certain fabrication steps , including information about the results of specific processes and(passive) caused byprocess variations
how much spatial variationcontributesto the process variation
any external variable that causes change in the resulting plastic parts dimensions or physical properties(passive) can be caused byProcess variation
by changes in process standard deviation(passive) caused bythe process variation
other factorsare causingprocess variation
the less impact of load capacitance variationresultedfrom process variation
the key variablescauseprocess variation
key variablescauseprocess variation
by causes that are out of their control(passive) are caused byprocess variation
the semiconductor process(passive) caused bythe process variation
that measurement errordoes ... contributeto the process variation
by power variability(passive) caused byprocess variation
This growth in performance and decrease inleadprocess variation
any variation of the oscillation frequencyresultedfrom process variation
which environmentinfluencesthe process of variation
certain sourcescausingprocess variation
orderto setthe variation process
Besides , the thickness of the interval between data layers is too largeresultsfrom process variation
the factorcontributing mostto the process variation
Circuit design and fabrication processes as well asmay causeprocess variations
the factorscausingprocess variability
factorscan influenceprocess variability
how muchcontributesto the process variation
greater internal scrap rates or process costs as wellmay causegreater internal scrap rates or process costs as well
in performance and leakage current varying together ... e.g. ... if the principal effect of a process variation is a change in threshold voltagemay resultin performance and leakage current varying together ... e.g. ... if the principal effect of a process variation is a change in threshold voltage
during manufacturingcausedduring manufacturing
to the reduction in the process variationleadto the reduction in the process variation
a greater change in characteristics of a very small device than a larger devicecausea greater change in characteristics of a very small device than a larger device
different response valuescausingdifferent response values
such that the effect of the voltage change(passive) caused bysuch that the effect of the voltage change
to less uniform product propertiesleadto less uniform product properties
to increased errors , risks and costsleadto increased errors , risks and costs
in significant operating characteristic variations between semiconductor devices of the same designmay resultin significant operating characteristic variations between semiconductor devices of the same design
significant uncertainty for circuit performance verificationcausessignificant uncertainty for circuit performance verification
to slight changes in electrical behaviorleadsto slight changes in electrical behavior
design loss(passive) caused bydesign loss
to potential quality concernscan leadto potential quality concerns
+ - 20 , 30 , or even 50 % performance variationcould cause+ - 20 , 30 , or even 50 % performance variation
in performance and leakage current varying togethermay resultin performance and leakage current varying together
in performance and leakage current varyingmay resultin performance and leakage current varying
to lower scrap and overall lower cost of qualityleadingto lower scrap and overall lower cost of quality
variation in output performance of the CMOS devicescan causevariation in output performance of the CMOS devices
in manufacture of systems that generate signals having a slow operating rangeresultin manufacture of systems that generate signals having a slow operating range
to product defectscan leadto product defects
yield problems in manufacturingmay causeyield problems in manufacturing
a considerable additional delay in the circuitcauseda considerable additional delay in the circuit
in a circuit performance distribution curveresultsin a circuit performance distribution curve
changes(passive) caused bychanges
product failures for our customerscausesproduct failures for our customers
difference between the threshold values in two devicesmay causedifference between the threshold values in two devices
density variations(passive) caused bydensity variations
in a wide range of possible device parametersmay resultin a wide range of possible device parameters
non - uniformity in device performance become more pronouncedcausenon - uniformity in device performance become more pronounced
to defect reduction and improvement in profits , employee morale , and quality of products or servicesleadto defect reduction and improvement in profits , employee morale , and quality of products or services
to defect reduction and improvement in profits employee morale and quality of products or servicesleadsto defect reduction and improvement in profits employee morale and quality of products or services
to variation in the ratecan leadto variation in the rate
to substrate - to - substrate variationleadingto substrate - to - substrate variation
the uncertainty problem(passive) caused bythe uncertainty problem
tuning frequency changes(passive) caused bytuning frequency changes
problems(passive) caused byproblems
unpredictable and undesired variations of the circuit parameters , which can adversely affect circuit performancecan causeunpredictable and undesired variations of the circuit parameters , which can adversely affect circuit performance
defects and to work systematically to manage those variations in order to eliminate the defectscausedefects and to work systematically to manage those variations in order to eliminate the defects
to work systematically to manage those variations in order to eliminate the defectscauseto work systematically to manage those variations in order to eliminate the defects