Loading ...

Blob

Smart Reasoning:

C&E

See more*

Qaagi - Book of Why

Causes

Effects

sparks in vacuum PDF Electrode damage caused by sparks in vacuum PDF(passive) caused byElectrode damage

calibration ... other factorsmay influenceelectrode measurements

to focus current for enhanced specificity(passive) is designedThe small electrode size

to 5 [ mu ] m(passive) is setElectrode width of the interdigital electrode

Changes in the thickness of stratum corneum layer ( e.g. , small abrasions ) andcould ... influencethe electrode size

10 SelectionSettingElectrode Type

T-2(passive) is designedElectrode type

according to user needs , high precision design , mesh , plate , component , Columnar , tubular and other shapes(passive) can be designedThe electrode size

rods / round bar – fishing rod holders and small stuffsettingelectrode size

the photolithography method and the lamination method For this reason(passive) created byelectrode shape

Background Mapping resolution(passive) is influenced byBackground Mapping resolution

NO ] measurement due to NO consumption and unstirred layer issuesinfluencedNO ] measurement due to NO consumption and unstirred layer issues

the magnitude of electromagnetic field generated and the field / current densityinfluencesthe magnitude of electromagnetic field generated and the field / current density

The resolution of mapping(passive) is influenced byThe resolution of mapping

in myocardial necrosismay resultin myocardial necrosis

a strong muscle contraction with even a very low level of current – around 3 - 5mA.createsa strong muscle contraction with even a very low level of current – around 3 - 5mA.

to visualization of small structurescontributesto visualization of small structures

piezoelectric layered thin film structures(passive) influenced bypiezoelectric layered thin film structures

the current density18 and influences the focality of brain modulation ( Figure 8)influencesthe current density18 and influences the focality of brain modulation ( Figure 8)

Blob

Smart Reasoning:

C&E

See more*