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oxygen impuritiescausedislocations and defects ... BMD : Bulk Micro Defect ... to become
misalignment in patterning silicon nitride hard mask 122 to the isolation structure , and misalignment in silicon nitride spacer 126 in gate structure formationcausedefect leading to leakage and device failure
STI stress effect ... has also been foundto causedefect and device leakage
34 results ... 28causesleakage and failure of the device
the printed image line end 34 results in a gap between the source 26 and drain 28causesleakage and failure of the device
Why multiple barb fittings failMismatches often occur with poor quality or worn toolingcausingmisaligned threads and barbsthat result in leakage
additional tissue captured by the retention disc , or additional defects which were not stented but only covered by the discspreventscomplete defect occlusion and promotes residual leakage
requires continuous electrolyte maintenancecausesleakage and failure of the device
contaminants(passive) caused byleakage ‚ system defects and oil line constriction
The residue 112can triggerleakage defects between wirings
various choroidal diseasescausingabnormalities of the RPE and leading to subretinal leakage
to leaks and breakagecan leadto leaks and breakage
an increase in the impedance of a signal linecausingan increase in the impedance of a signal line
to contamination of land , groundwater , surface water and aircan leadto contamination of land , groundwater , surface water and air
to energy waste , greater stress on components , more frequent repairs , temperature fluctuations , increased noise , polluted air quality , and even shortened service lifeleadto energy waste , greater stress on components , more frequent repairs , temperature fluctuations , increased noise , polluted air quality , and even shortened service life
to poor device performance , low yields , and reliability issuesleadto poor device performance , low yields , and reliability issues
from the breakage of substantially weak spots of said product , ( c ) applying a gas pressure to said product so as to attain a first pressure within said product which said first pressure is a pressure that in the absence of said constraints would be desctructive of said product , ( d ) reducing the pressure within said product upon its attaining said first pressure to a second pressure which itself is a pressure in the absence of said constraints which would be destructive of said product , ( e ) detecting any gas pressure decrease within said product over a testing period commencing upon its attaining said second pressure , and ( fresultingfrom the breakage of substantially weak spots of said product , ( c ) applying a gas pressure to said product so as to attain a first pressure within said product which said first pressure is a pressure that in the absence of said constraints would be desctructive of said product , ( d ) reducing the pressure within said product upon its attaining said first pressure to a second pressure which itself is a pressure in the absence of said constraints which would be destructive of said product , ( e ) detecting any gas pressure decrease within said product over a testing period commencing upon its attaining said second pressure , and ( f
foul odors and so oncausesfoul odors and so on
extensive damage from fires or explosionscan causeextensive damage from fires or explosions
The pathogenesis of cerebrospinal fluid ( CSF ) hypovolemia is supposed(passive) to be caused byThe pathogenesis of cerebrospinal fluid ( CSF ) hypovolemia is supposed