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11 , how an appropriate event sensor , such as a chemical sensor , a biological sensor , and other kinds of sensors ... a mannercausesdeflection in the beam
the conditions of support ... the shape of the section , the proportions of tension and compression reinfor- cement in the section and their levels of stress under service loading(passive) is ... influenced bydeflection of beams
many factors including loading , temperature and fabrication errors(passive) can be caused byDeflection in a beam
the variation of the refractive index along the slit(passive) can be caused byDeflection of the beam
The sudden change of directionwill causedeflection of the beam
small defects on the surface 27causedeflection of the beam
the tension in the line loading the beam in compression eccentric to the beam 's longitudinal axis(passive) is caused byDeflection of the beam
This chargewill causedeflection of the beam
which is achieved by more complex patternto preventdeflection of beams
corresponding motions ... the reflective element 104 bcausesdeflection of the beam
Lens 51bcausesdeflection of the beam
orderto causedeflection on the beam
The horizontal timing signalcausesdeflection of the beam
Increase in the voltage difference between the platescausesdeflection of the beam
Security stopspreventdeflection of the beam
to transfer external fluid pressure load to the piezoelectric beamto causedeflection of the beam
electromagnetic fields produced bythe coils of a deflection yoke located on the neck of the tube(passive) is caused byDeflection of the beams
electromagnetic fields produced by the coils of a deflection yoke located on the neck of the tube(passive) is caused byDeflection of the beams
The " parabolic lens " generated by flow through the sample chamberwill causedeflection of both beams
whereby deflection of the platform is transmitted to the deflection beamsto causedeflection of the deflection beams
using the effects of magnetic forcesto causea deflection of the beams
One can use the polysilicon layer in the CMOS process to build resistors within the membrane , and heating the membrane with an electric currentwill causedeflection of the beams
Thus , deflection of the platform is transmitted to the deflection beamsto causedeflection of the deflection beams
the openings 368 in the insulator housingpreventover deflection of the beams
settlement of the back concrete retaining - wall foundationscauseddeflection of interior beams
to flex and then return to a non - deflected position upon said protrusion meeting with saidis causedto flex and then return to a non - deflected position upon said protrusion meeting with said
aberrations(passive) caused byaberrations
to flex and secureis causedto flex and secure
to cracking of partition walls and secondary load pathscan leadto cracking of partition walls and secondary load paths
a response in the sensing means due to the relative action or deflection in the second beamcreatesa response in the sensing means due to the relative action or deflection in the second beam
an electrical characteristic of the sensing element(passive) is influenced byan electrical characteristic of the sensing element
the transfer image(passive) caused bythe transfer image
spherical aberration(passive) caused byspherical aberration
elastic deformation in the beams so that the sample material is placed in stress , commencing the fracture of the sample material by impacting the sample material while the sample material is in stress , maintaining at least some stress in the sample material after the fracture commences through the elastic deformation of the beams , and measuring the amount of resistance , to fracture , ofto createelastic deformation in the beams so that the sample material is placed in stress , commencing the fracture of the sample material by impacting the sample material while the sample material is in stress , maintaining at least some stress in the sample material after the fracture commences through the elastic deformation of the beams , and measuring the amount of resistance , to fracture , of
The puddling(passive) was caused byThe puddling
stress in the gauges , which in turn would be detected as an unbalance in the bridge circuitwould causestress in the gauges , which in turn would be detected as an unbalance in the bridge circuit
to strong reduction in the shear capacity of the hollow core slabsleadsto strong reduction in the shear capacity of the hollow core slabs
the decreased stability(passive) is caused bythe decreased stability
cracks in exterior walls that provide an entry for waters which accelerates the breakdown of the wall materialscausescracks in exterior walls that provide an entry for waters which accelerates the breakdown of the wall materials