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Qaagi - Book of Why

Causes

Effects

additional parasitic capacitancecan causecapacitance mismatching

the formation of a depletion layer at the interface between the dielectric layer 86 and the tunnel SiO2 layer 101(passive) caused bycapacitor capacitance

Multilayer DC capacitor RadialleadsX7R Dielectric Capacitance 100

The design of a crystal oscillator using a FET requires careful layout and minimum use of componentsto preventinterelectrode capacitance

the pad(passive) contributed byTheextra capacitance

the curved electrode , and longer traveling path of the s - shaped electrode(passive) caused byFluidic capacitance

the discontinuity between the metal of a hole resonator(passive) caused bya fringing capacitance

approx<30Ω buzzertriggeredCapacitance 2nF~200μF

set upcausingfringing capacitance

from increased resistance at the capacitor lower portion caused by unsatisfactory fillingresultingfrom increased resistance at the capacitor lower portion caused by unsatisfactory filling

the electrochemical double layer capacitor ( EDLC ) and pseudocapacitive of the polyNi(salphen(passive) caused bythe electrochemical double layer capacitor ( EDLC ) and pseudocapacitive of the polyNi(salphen

the distortion(passive) caused bythe distortion

into the circuit to provideis ... designedinto the circuit to provide

of Graphene and Boron Nitride LayersComposedof Graphene and Boron Nitride Layers

from miniaturization of the semiconductor devicesresultingfrom miniaturization of the semiconductor devices

the VCO to generate a frequency that is within the PLL 's frequency capture rangecausesthe VCO to generate a frequency that is within the PLL 's frequency capture range

according to equation ( 14resultsaccording to equation ( 14

to Shieldingleadto Shielding

loss of top - endcan causeloss of top - end

to 8x14 = 112pF 09:28:43 08 - 07 - 2017 Reg & H00 : 24 Reg & H01 : 22 Reg & H02 : C2 Reg & H03setto 8x14 = 112pF 09:28:43 08 - 07 - 2017 Reg & H00 : 24 Reg & H01 : 22 Reg & H02 : C2 Reg & H03

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Smart Reasoning:

C&E

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